Radiation damage remains the principal limitation in achieving higher resolution in cryo-electron microscopy (cryo-EM), despite advances in cryoprotection and low-dose imaging. Researchers have proposed that using pulsed electron beams could allow relaxation between energy deposition events, potentially reducing damage. However, the actual existence of such a mitigation effect remains unclear.
Ultrafast cryo-EM study challenges assumptions on pulsed electron beam mitigation of radiation damage
